Soft Error Evaluation

These days, soft errors do not only represent a problem for equipment demanding high reliability such as large capacity routers and servers, aircrafts and medical instruments, but also for automotive and household appliances, in that need for wide-spread response becomes increasingly inevitable. We at OKI Engineering provide soft error evaluations for semiconductor memories.

Soft Error Test Service

• We can easily carry out soft error tests with tractable Americium.
• Specimens' operating conditions can be changed easily using an LSI tester.
• We carry out everything from opening to measurement of the specimen.

Soft Error Test Outline

1. Open and expose the IC chip.
2. Irradiate α-rays onto the exposed surface and observe the behavior.

Soft Error Test Outline

Soft Error Test Flow - Test Result (ex. SRAM)

• List of Services
• EMC Test
• Environmental Systems
• Instruments Calibration
• Reliability Test, Evaluation and Analysis
• Integrated ESD Service
• Tester Program & Device Testing
  • Next-Generation Power Semiconductors
  • Test Solution Services for Testers Manufactured by Cloud Testing Service Inc.(CTS)
  • Reliability Evaluations of Non-volatile Memory
  • Power Supply Modules
  • Power Plug Tracking
  • AEC-Q100 Tests
  • Test Program Development
  • Wafer-level Reliability Evaluation
  • Measurements and Evaluations
    • GaN SiC Temperature Tests
    • Example of Power MOS-FET Measurement with WTS-700
    • Shmoo Plot Margin Analysis
    • Automotive Linear Device Evaluation
    • Reliability Evaluation Testing
    • Hall IC Evaluation
    • Soft Error Evaluation
  • Screening
  • Major Equipment for Electronic Devices Testing

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