Wintest WTS-700 Analog and Mixed Signal Device Tester

Capable of testing multiple devices in parallel across a two-station quadruple-unit system, the WTS-700 enables us to test automotive devices at lower cost thanks to increased throughput rates at higher accuracy. The four measuring sites of the WTS-700 include:

1. a medium voltage, high current （36V/28A） unit
2. a multi-channel DC unit for every single pin
3. two medium-voltage units for different voltage and current ranges capable of floating measurements

Tester Configuration

• List of Services
• EMC Test
• Environmental Systems
• Instruments Calibration
• Reliability Test, Evaluation and Analysis
• Integrated ESD Service
• Tester Program & Device Testing
  • Next-Generation Power Semiconductors
  • Test Solution Services for Testers Manufactured by Cloud Testing Service Inc.(CTS)
  • Reliability Evaluations of Non-volatile Memory
  • Power Supply Modules
  • Power Plug Tracking
  • AEC-Q100 Tests
  • Test Program Development
  • Wafer-level Reliability Evaluation
  • Measurements and Evaluations
  • Screening
  • Major Equipment for Electronic Devices Testing
    • Semiconductor Device Analyzer
    • Wintest WTS-700 Analog and Mixed Signal Device Tester

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