Location: Home > Services > Tester Program & Device Testing > Screening > FPGA Screening for Deployment in Space


FPGA Screening for Deployment in Space

When using an FPGA in the harsh environment of aerospace, screening by dynamic burn-in is required in order to ensure high reliability.

We at OKI Engineering perform screening on aerospace requirement using our proprietary dynamic burn-in equipment. Upon request, we respond from FPGA data writing, testing of electrical characteristics with our LSI tester all the way up to dynamic burn-in as a one-stop service.

  • Screening by means of dynamic burn-in test
  • FPGA data writing, testing of electrical characteristics with our LSI tester
  • Plus -- as a one-stop -- dynamic burn-in tests

Features of our Dynamic Burn-in Equipment (OEG-DBS2)

  • Capable of running long test patterns (1 million steps max.)
  • Supports up to 256 signal pins
  • Up to four different patterns of data writing burn-in in parallel

Supported Components (manufactured by Actel)

Supported Components (manufactured by Actel)

  • RTAX250SL
  • RTAX2000S
  • RTSX32
  • RTSX72
  • RP1280A
  • RT14100A, etc.

Screening Flow

Screening Flow

Employed Equipment

Dynamic burn-in equipment

Screening of electronic devices contributed to Japan's asteroid explorer spacecraft named "Hayabusa" (the falcon) which collected dust specimen on the asteroid 25143 Itokawa on November 20th., 2005.

Certificates of Appreciation

By screening electronic devices (FPGA), OKI Engineering, as one of the Hayabusa project support team companies, has contributed to the improvement of the reliability of the asteroid explorer "Hayabusa". In December 2010, OEG was awarded certificates of appreciation by Banji Kaieda, Minister of Space Development and Yoshiaki Takagi, Minister of Education, Culture, Sports, Science and Technology (MEXT).

  • Certificates of Appreciation
  • Asteroid explorer Hayabusa
  • Certificates of Appreciation

Top of this page