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Major Equipment for Electronic Devices Testing

OKI Engineering uses only forefront test equipment and solutions which are continuously under maintenance and regular inspections to assure us our customers' satisfaction.

1. Linear IC Analog Dynamic Test System Wintest WTS-700

System Specifications
Analog Pin Measuring Unit
  • 12-pin / board x 2
  • Independent VFIM/IFVM/VM measuring of every pin
  • 14-bit meter for every pin, 16-bit every 12 pins
  • Delta-function: adds DAC output to the APMU pin
Medium-Power Pin Unit
  • Measures higher voltages and currents providing more accuracy than APMU
  • Two-channel loading
  • VFIM/IFVM/VM
  • Parser measurement mode besides DC measuring mode
  • Applicable to floating voltage
  • Two types varying in range

2. Linear IC Tester MSD MST 2000

System Specifications
Application
DC parameter measurement
Voltage supply
50V max
Bias current resolution
0.025pA
Applicable devices
OpAmps, ADCs, comparators, regulators, analog switches, digital ICs

3. SoC Tester Advantest T6575

System Specifications (512CH, 1TH)
Data rate
500MHz max
TTB
64MW x 3bit/pin VGC: 4MW
DPS
8V-2A 16CH, 40V-80mA 8CH
TG
6TE/pin
Options
ALPG, IDDQ, A/D, D/A

4. Wafer Prober Tokyo Electron P12-XL

System Specifications
Applicability
12 and 8 inch (6 inch and die possible)
High temperature
up to 125℃
Low temperature
down to -40℃

5. Logic Tester Advantest T3347A

System Specifications (256CH, 1TH)
Clock rate
40 MHz max
TTB
256KW x 3bit/pin VGC: 2MW
DPS
8V-5A 2CH, 8V-2A 2CH, 8V-1A/30V-500mA 8CH
(optionally 8V 8CH sum)
TG
48TE, 16STROBE
Options
ALPG, ADC

6. Logic Tester Advantest T3320

System Specifications (256CH, 1TH)
Clock rate
30 MHz max
TTB
64KW x 3bit/pin VGC: 4KW
DPS
8V-5A 2CH, 30V-2A 2CH
TG
16TE, 4STROBE
Options
ALPG

7. Memory Tester Advantest T5361

System Specifications (120Dr, 4OI/O)
Data rate
120 MHz max
DPS
8V-5A 8CH, partly 40V 2A

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