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- Major Equipment for Electronic Devices Testing
Services
Major Equipment for Electronic Devices Testing
OKI Engineering uses only forefront test equipment and solutions which are continuously under maintenance and regular inspections to assure us our customers' satisfaction.
1. Linear IC Analog Dynamic Test System Wintest WTS-700
System Specifications
- Analog Pin Measuring Unit
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- 12-pin / board x 2
- Independent VFIM/IFVM/VM measuring of every pin
- 14-bit meter for every pin, 16-bit every 12 pins
- Delta-function: adds DAC output to the APMU pin
- Medium-Power Pin Unit
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- Measures higher voltages and currents providing more accuracy than APMU
- Two-channel loading
- VFIM/IFVM/VM
- Parser measurement mode besides DC measuring mode
- Applicable to floating voltage
- Two types varying in range
2. Linear IC Tester MSD MST 2000
System Specifications
- Application
- DC parameter measurement
- Voltage supply
- 50V max
- Bias current resolution
- 0.025pA
- Applicable devices
- OpAmps, ADCs, comparators, regulators, analog switches, digital ICs
3. SoC Tester Advantest T6575
System Specifications （512CH, 1TH）
- Data rate
- 500MHz max
- TTB
- 64MW x 3bit/pin VGC: 4MW
- DPS
- 8V-2A 16CH, 40V-80mA 8CH
- TG
- 6TE/pin
- Options
- ALPG, IDDQ, A/D, D/A
4. Wafer Prober Tokyo Electron P12-XL
System Specifications
- Applicability
- 12 and 8 inch （6 inch and die possible）
- High temperature
- up to 125℃
- Low temperature
- down to -40℃
5. Logic Tester Advantest T3347A
System Specifications （256CH, 1TH）
- Clock rate
- 40 MHz max
- TTB
- 256KW x 3bit/pin VGC: 2MW
- DPS
- 8V-5A 2CH, 8V-2A 2CH, 8V-1A/30V-500mA 8CH
（optionally 8V 8CH sum） - TG
- 48TE, 16STROBE
- Options
- ALPG, ADC
