Measurements and Evaluations

Employing IC testers, we perform characteristics measurement and characteristics evaluation （measurement of actual AC characteristics and margin measurement） not only at room temperature, but also at high-low temperatures.

Board Design & Manufacture for 1000-pin-class MCMs

This is a case example of measuring board design and manufacture tailored to 1000-pin-class MCM （multi-chip module） products in development （CPU & Memory） and measurement performed in accordance with assembly configurations.

Bare Chip Probing

Actual performance of bare chip probing spans over 7 to 100 pads and chip sizes between 1 and 5 square millimeters at room temperature.

12" TEG （Test Element Group） Wafer Measurement

Example 1 of basic data acquisition using TEG: I-V characteristics （to the power of -12~-13 ampere measuring possible）

Example 2 of basic data acquisition using TEG: C-V characteristics

Automotive Linear Devices Evaluation

In order to use automotive devices at maximum level of confidence we perform evaluations only with the latest linear testers. The wide range of linear IC tester applicable devices include AC-DC power control ICs, precision OpAmps, motor drivers, telecom devices, all kinds of sensors, analog and digital audio / other small signal ICs, etc.

• List of Services
• EMC Test
• Environmental Systems
• Instruments Calibration
• Reliability Test, Evaluation and Analysis
• Integrated ESD Service
• Tester Program & Device Testing
  • Next-Generation Power Semiconductors
  • Test Solution Services for Testers Manufactured by Cloud Testing Service Inc.(CTS)
  • Reliability Evaluations of Non-volatile Memory
  • Power Supply Modules
  • Power Plug Tracking
  • AEC-Q100 Tests
  • Test Program Development
  • Wafer-level Reliability Evaluation
  • Measurements and Evaluations
    • GaN SiC Temperature Tests
    • Example of Power MOS-FET Measurement with WTS-700
    • Shmoo Plot Margin Analysis
    • Automotive Linear Device Evaluation
    • Reliability Evaluation Testing
    • Hall IC Evaluation
    • Soft Error Evaluation
  • Screening
  • Major Equipment for Electronic Devices Testing

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