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AEC-Q100 TestsAll tests are compliant with Automotive Electronics Council (AEC-Q100) regulations.

AEC-Q100 is a technical standard for various reliability tests for integrated circuits (IC) developed for automotive applications. We at OKI Engineering conduct all AEC-compliant reliability tests for automotive ICs.

AEC-Q100 Test Items

AEC-Q100 Environmental Stress Test

Referenced Standard Symbol Test Item Details
JESD22 A113
J-STD-020
PC Preconditioning
SMD only; moisture preconditioning for THB/HAST, AC/UHST, TC & PTC
JESD22 A101
JESD22 A110
THB or
HAST
High temperature/high humidity bias test
Highly-accelerated stress test
JESD22 A102 or
JESD22 A118
AC or
UHST
Autoclave
Unbiased highly-accelerated stress test
JESD22 A104 TC Temperature cycling test
JESD22 A105 PTC Power and temperature cycling test

AEC-Q100 Accelerated Life Tests

Referenced Standard Symbol Test Item Details
JESD22 A108 HTOL High temperature operation life
AEC-Q100-0008 ELFR Early failure rate
AEC-Q100-0005 EDR Program/erase endurance, data retention (Non-volatile memory)

AEC-Q100 Package Assembly Integrity Tests

Referenced Standard Symbol Test Item Details
AEC-Q100-001 WBS Wire bond shear strength
Mil-STD-883
Method2011
WBP Wire bond pull strength
JESD22 B102 SD Solder wettability
JESD22 B100
JESD22 B108
PD Physical dimension
AEC-Q100-010 SBS Solder ball shear strength
JESD22 B105 LI Lead integrity

AEC-Q100 Die-Level Reliability Tests

Referenced Standard Symbol Test Item Details
JESD61 EM Electromigration
JESD35 TDDB Time-dependent dielectric breakdown (oxide film life)
JESD60&28 HCI Hot carrier injection test
JESD90 NBTI Negative bias temperature instability
JESD61,87,&202 SM Stress migration

AEC-Q100 Electrical Characteristics Assessment

Referenced Standard Symbol Test Item Details
User/Supplier Specification TEST Pre and post electrical stress test
AEC-Q100-002
AEC-Q100-003
HBM/MM Human model/machine model electrostatic discharge test
AEC-Q100-011 CDM Charged device model electrostatic discharge test
AEC-Q100-004 LU Latch-up
AEC-Q100-009 ED Electrical distribution assessment
AEC-Q100-006 GL Gate leakage

AEC-Q100 Cavity Package Test (Ceramic Package)

Referenced Standard Symbol Test Item Details
JESD22 B104 MS Mechanical shock test
JESD22 B103 VFV Variable frequency vibration test
MIL-STD-883
Method 2001
CA Constant acceleration test
MIL-STD-883
Method 1014
GFL Gross and fine leakage test
- DROP

Drop test

MIL-STD-883
Method 2004
LT Lead torque test
MIL-STD-883
Method 2019
DS Die shear test
MIL-STD-883
Method 1018
IWV Internal water vapor contents test

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