Proprietary Screening Jig Manufacture

Conventionally, LSI testers are employed for the purpose of screening LSIs, etc. However, depending on the device, test program generation and test board manufacture and such, may require much preparation time. As one solution, our Company recommends a simplified method involving a measurement tool specifically customized to the functions that our client wishes to confirm. According to this operation, preparation time and cost can be reduced.

Furthermore, we provide a special jig to enable stable evaluation of temperature characteristics measurements that can be carried out within short time.

Please do not hesitate to contact us.

High-Low temperature operation screening example with a special jig.

• List of Services
• EMC Test
• Environmental Systems
• Instruments Calibration
• Reliability Test, Evaluation and Analysis
• Integrated ESD Service
• Tester Program & Device Testing
  • Next-Generation Power Semiconductors
  • Test Solution Services for Testers Manufactured by Cloud Testing Service Inc.(CTS)
  • Reliability Evaluations of Non-volatile Memory
  • Power Supply Modules
  • Power Plug Tracking
  • AEC-Q100 Tests
  • Test Program Development
  • Wafer-level Reliability Evaluation
  • Measurements and Evaluations
  • Screening
    • Screening Flow
    • Screening Jig Manufacture
    • Dynamic Burn-in
    • Passive Components Screening
    • FPGA Screening for Deployment in Space
    • Screening for Counterfeit Electronic Parts
  • Major Equipment for Electronic Devices Testing

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