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Screening for Counterfeit Electronic Parts

The number of counterfeit electronic parts has been rapidly increasing in recent years. Electronic parts are used in a wide variety of products in the fields of industries, automobile, defense, and aerospace. Thus, accidental use of counterfeit products will cause a loss of trust in your products, an increase in production manufacturing costs, and what is worse, a threat to consumer security. OKI Engineering provides one-stop solutions for screening of counterfeit electronic parts.

  • Screening is performed by electrical characteristic measurements of market-available products.
  • For semiconductor components that need test patterns such as LSI, test patterns and programs are created from device datasheets to perform detailed electrical characteristic measurements including functional characteristics and DC/AC characteristics.
  • Applying stresses of environmental tests including high-temperature storage tests, high-temperature operation tests, and temperature cycling tests allows defective products to be screened effectively.

Investigation Example of Degraded Threshold (Vth) Characteristics of a Controller LSI

Target Sample
Controller LSI
Overview
After a market-available controller LSI was used in a company’s product to be shipped to the market, it caused a malfunction. The investigation identified degraded threshold (Vth) characteristics of the controller LSI by a high-temperature energization test. Screening by the high-temperature energization test could prevent a product with characteristic degradation from being mixed in.
  • Vth fluctuation  graph  Non-defective products
    Vth fluctuation graph Non-defective products
    Vth fluctuation by the high-temperature operation test is not identified in non-defective products.
  • Vth fluctuation  graph  Defective products
    Vth fluctuation graph Defective products
    Vth fluctuation by the high-temperature operation test is identified in products with characteristic degradation

Investigation Example of Products with Characteristic Degradation of a general purpose LSI

Target Sample
General purpose LSI
Overview
Screening of a market-available general purpose LSI was performed. As a result, mixing of defective products beyond a manufacture’s standard was identified by input leakage current measurements. Removing the defective products could prevent potential failures prior to manufacturing.

Input leakage current   Distribution graph of measurement values
Input leakage current Distribution graph of measurement values

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