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Screening for Counterfeit Electronic Parts
The number of counterfeit electronic parts has been rapidly increasing in recent years. Electronic parts are used in a wide variety of products in the fields of industries, automobile, defense, and aerospace. Thus, accidental use of counterfeit products will cause a loss of trust in your products, an increase in production manufacturing costs, and what is worse, a threat to consumer security. OKI Engineering provides one-stop solutions for screening of counterfeit electronic parts.
- Screening is performed by electrical characteristic measurements of market-available products.
- For semiconductor components that need test patterns such as LSI, test patterns and programs are created from device datasheets to perform detailed electrical characteristic measurements including functional characteristics and DC/AC characteristics.
- Applying stresses of environmental tests including high-temperature storage tests, high-temperature operation tests, and temperature cycling tests allows defective products to be screened effectively.
Investigation Example of Degraded Threshold (Vth) Characteristics of a Controller LSI
- Target Sample
- Controller LSI
- Overview
- After a market-available controller LSI was used in a company’s product to be shipped to the market, it caused a malfunction. The investigation identified degraded threshold (Vth) characteristics of the controller LSI by a high-temperature energization test. Screening by the high-temperature energization test could prevent a product with characteristic degradation from being mixed in.
Vth fluctuation graph Non-defective products
Vth fluctuation by the high-temperature operation test is not identified in non-defective products.
Vth fluctuation graph Defective products
Vth fluctuation by the high-temperature operation test is identified in products with characteristic degradation
Investigation Example of Products with Characteristic Degradation of a general purpose LSI
- Target Sample
- General purpose LSI
- Overview
- Screening of a market-available general purpose LSI was performed. As a result, mixing of defective products beyond a manufacture’s standard was identified by input leakage current measurements. Removing the defective products could prevent potential failures prior to manufacturing.
Input leakage current Distribution graph of measurement values
