Semiconductor Device Parameter Analyzer

Semiconductor Device Analyzer B1500A (Agilent Technologies)

We have expanded our range of TEG evaluations with a newly acquired tester. Thanks to this newly acquired semiconductor device parameter analyzer, B1500A, manufacured by Agilent Technologies, we are equipped and prepared to carry out charge pumping by means of NBTI, PGU and capacitance measurement using CMU, in addition to track-records collecting TZDB, TDDB, plus Tr characteristic degradation tests with hot carriers.

Configuration

Extended Possibilities

• Possibility of "Timing On-the-Fly NBTI test" which can lower the recovery phenomenon on returning from degradation during stress OFF to characterization.
• Thanks to the built-in PGU, charge pumping provides a better response than a GPIG controlled external pulse generator, and can shorten test time.
• Allows direct measurement of the capacity of,the gate oxide without need for an LCR meter.
• Parallel evaluation is possible vis-a-vis time consuming TDDB tests.

• List of Services
• EMC Test
• Environmental Systems
• Instruments Calibration
• Reliability Test, Evaluation and Analysis
• Integrated ESD Service
• Tester Program & Device Testing
  • Next-Generation Power Semiconductors
  • Test Solution Services for Testers Manufactured by Cloud Testing Service Inc.(CTS)
  • Reliability Evaluations of Non-volatile Memory
  • Power Supply Modules
  • Power Plug Tracking
  • AEC-Q100 Tests
  • Test Program Development
  • Wafer-level Reliability Evaluation
  • Measurements and Evaluations
  • Screening
  • Major Equipment for Electronic Devices Testing
    • Semiconductor Device Analyzer
    • Wintest WTS-700 Analog and Mixed Signal Device Tester

CONTACT