Observations and Analyses

Accurate observational studies and analysis of components and materials require elemental analysis. Furthermore, as part of reliability testing, observation and element analysis yield correct understanding of physicality and are practiced as effective methods of advancing research and development.

As a practical example, a wide range of observations and analysis are performed with Scanning Electron Microscopes (SEM) and Transmission Electron Microscopes (TEM) using ion beams to observe microstructure and cross-section of LSIs, electronic components, materials, etc., and analysis of organic substances with electron microanalyzer (EPMA) or ferrier transform infrared spectroscopy.

  • Transmission Electron Microscope (TEM)

  • Lattice image

  • Scanning Electron Microscope (SEM)

  • Evidence of damage

  • Electron Micro Analyzer

  • Example of face analysis

  • X-ray CT equipment

  • Three-dimensional image of a BGA

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