Reliability Evaluations of Non-volatile Memory

A storage device using a non-volatile memory provides many advantages including low noise, fast PC startup, fast read/write performance, and enhanced shock resistance. A greater variety of non-volatile memories with larger capacity have become used in a wider range of devices, thus expanding the market rapidly. On the other hand, troubles with non-volatile memories in the market are often caused by read/write endurance and data retention characteristics. It is significant to thoroughly evaluate the reliability of non-volatile memories when they are used. OKI Engineering provides one-stop solutions for the reliability evaluations of non-volatile memories including eMMC.※1 .

• ※1：“eMMC,” established by Joint Electron Device Engineering Council (JEDEC), is the standard for an external memory system toward embedded devices using flash memories. By combining a NAND flash memory with a control circuit in a single package, “eMMC” is connected to external devices with the same interface as Multi Media Card (MMC), which is a memory card standard. The transfer rate is slow. However, “eMMC” is small size and uses less power, so it is classified under the same category as smartphones and tablet PCs and has been widely used as a fast built-in memory system for embedded devices such as digital consumer products and car navigation systems.

Examples of eMMC’s Read/Write Endurance and Data Retention/Endurance Tests

The room temperature/High-temperature endurance evaluations, and the retention evaluations of both data retention time and read time transition were conducted on the following three eMMCs, which are multi-chip packages (control chips + NAND flash chips) produced by each of three manufacturers.

Target Sample

Three eMMCs from each of three manufacturers

Multi-chip packages (control chips + NAND flash chips)

Samples of Evaluations

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  Room Temperature/Room Temperature Endurance Evaluations

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  Retention Evaluations Data Retention Time

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  Retention Evaluations Read Time Transition

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  IOPS（Input/Output Per Second）Evaluations

Features of Reliability Evaluations for Non-volatile Memor

Performance evaluations which cannot be obtained information from data sheet of non-volatile memories are available.

• Performance evaluations including endurance (the number of write operations), data retention, and IOPS (Input/Output Per Second) can be conducted.

Performance evaluations under the common evaluation conditions are available.

• Performance evaluations of different non-volatile memories manufactured by different companies can be conducted under the common evaluation conditions

Flexible tests satisfied requirements of systems to be used are available

• Flexible settings including write sequence, the number of read/write operations, and read time are available.

Detailed error information is available.

• In addition to bad block information when an error occurs, detailed information about when an error occurs from the error flag can be obtained.

The reliability data is available for purchase.

• As for the eMMCs from each of the manufacturers, which we evaluated, the reliability data specifying the product names is available for purchase.

• List of Services
• EMC Test
• Environmental Systems
• Instruments Calibration
• Reliability Test, Evaluation and Analysis
• Integrated ESD Service
• Tester Program & Device Testing
  • Next-Generation Power Semiconductors
  • Test Solution Services for Testers Manufactured by Cloud Testing Service Inc.(CTS)
  • Reliability Evaluations of Non-volatile Memory
  • Power Supply Modules
  • Power Plug Tracking
  • AEC-Q100 Tests
  • Test Program Development
  • Wafer-level Reliability Evaluation
  • Measurements and Evaluations
  • Screening
  • Major Equipment for Electronic Devices Testing

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