Observations and Analyses

Accurate observational studies and analysis of components and materials require elemental analysis. Furthermore, as part of reliability testing, observation and element analysis yield correct understanding of physicality and are practiced as effective methods of advancing research and development.

As a practical example, a wide range of observations and analysis are performed with Scanning Electron Microscopes （SEM） and Transmission Electron Microscopes （TEM） using ion beams to observe microstructure and cross-section of LSIs, electronic components, materials, etc., and analysis of organic substances with electron microanalyzer （EPMA） or ferrier transform infrared spectroscopy.

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  Transmission Electron Microscope （TEM）
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  Lattice image

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  Scanning Electron Microscope （SEM）
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  Evidence of damage

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  Electron Micro Analyzer
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  Example of face analysis

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  X-ray CT equipment
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  Three-dimensional image of a BGA

• List of Services
• EMC Test
• Environmental Systems
• Instruments Calibration
• Reliability Test, Evaluation and Analysis
  • Vibration and Shock Tests
  • Failure Analyses
  • Non-defective Analyses
  • Non-Destructive Testing
  • Observations and Analyses
  • X-Ray Fluoroscopic Examination
  • Ion Migration Tests for Printboards
  • Lead-free Assembly Evaluation
  • Environmental Reliability Testing
  • Special Environmental Tests
  • Dust & Dust Endurance Tests
  • Salt Spray Tests
  • Gas Corrosion Tests
• Integrated ESD Service
• Tester Program & Device Testing

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